Ⅰ. DC measurement method

1. Impact method:

By applying instantaneous magnetic field changes (such as pulse magnetic field) to the sample, the induced electromotive force of the material during the magnetic field change is measured to determine the magnetic parameters, such as coercive force, remanence, etc. This method is suitable for measuring the DC magnetic properties of hard magnetic materials.

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2. Hysteresis loop method:

Use a DC magnetic field to magnetize the sample, gradually change the magnetic field intensity, and measure the curve of the sample's magnetic flux density or magnetic induction intensity changing with the magnetic field, that is, the hysteresis loop. Important magnetic parameters such as saturation magnetization, coercivity, and remanence can be obtained from the hysteresis loop, which can comprehensively reflect the DC magnetic properties of the material and is often used in the research and quality control of soft and hard magnetic materials.

Ⅱ. Communication measurement method

1. AC magnetization curve method:

Under AC magnetic fields of different frequencies, measure the relationship between the magnetic flux density or magnetic induction intensity of the material and the magnetic field intensity. This method can be used to analyze the magnetization characteristics of materials in alternating magnetic fields, as well as evaluate the performance of materials in AC application scenarios (such as transformers, inductors, etc.), and can obtain parameters such as magnetic permeability and loss.

2. AC hysteresis loop method:

Apply an AC magnetic field and measure the hysteresis loop of the sample. It is similar to the DC hysteresis loop method, but focuses more on studying the hysteresis characteristics and energy loss of materials under AC magnetic fields. It is very important for evaluating the performance of amorphous nanocrystalline materials in high-frequency AC applications, such as high-frequency transformers. Core material.

Ⅲ. Other measurement methods

1. Single chip method:

One of the mainstream international amorphous measurement methods, such as American standard A932 and Japanese standard H7152, both proposed this method, and it was also clearly stated in my country's GB/T 19345.1 standard revised in 2015. The measurement data of the single-chip method can better reflect the magnetic properties of the material itself, and eliminates the need for complicated processes such as sample preparation and winding. There are currently two types of single-chip magnetic field measurement: current method (MC method) and magnetic field coil method (H-Coil method).

2. Ring sample method

In accordance with relevant standards (such as GB/T 19346.1-2017), amorphous nanocrystalline materials were made into ring-shaped specimens for AC magnetic performance testing. This method is suitable for measuring the magnetic parameters of ring-shaped amorphous nanocrystalline materials and is widely used in scientific research and production.